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Spectral engineers are conducting
leading edge research and developing innovative solutions in the
areas of design and design for test (DFT) technologies. We are
developing methodologies and point solutions that accelerate design
creation and reduce cost of test. Our areas of interest include:
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Designing complex memory sub-systems (CAMS, TLBs Caches) and their building blocks (SRAMs, Register Files, ROMs) with a special interest in extreme low power applications. We have developed a memory compilation solution that is radically different from any other solution in the marketplace.
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Design For Test (DFT) solutions geared at multi-million gate designs. We offer point solutions that automate the TPI (Test Point Insertion) process in a customers eco sytem resulting in an extremely favorable results with minimal impact on area and timing metrics, this solution is targeted for extremely large design and employs very unique testability measures that are proprietary to Spectral.
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Our mixed-signal design Engineers & software developers have developed a reference flow using industry standard EDA tools that can be used by CAD developers and semiconductor companies with limited resources.
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